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Single Crystal X-ray Diffraction Measurements at High Pressure and Low Temperature

Center of Instrumental Analysis, Yamaguchi University Volume 10 Page 6-11
published_at 2002
KJ00000199273.pdf
[fulltext] 739 KB
Title
<研究報告>低温高圧下における単結晶X線回折実験技術の開発と適用
Single Crystal X-ray Diffraction Measurements at High Pressure and Low Temperature
Creators Asahi Takanao
Creators Moriwake Satoshi
Creators Kawamura Yukihiko
Creators Hasebe Katsuhiko
Source Identifiers
We have been developing experimental and data analysis techniques for single crystal X-ray diffraction measurements at high pressure and low temperature using 18kW X-ray generator, off-center type four-circle goniometer, He-gas cryostat and diamond anvil cell. Results for CsH_2PO_4,which has pressure-induced antiferroelectric phase below 125K and above 0.33GPa, are presented.
Languages jpn
Resource Type departmental bulletin paper
Publishers 山口大学機器分析センター
Date Issued 2002
File Version Version of Record
Access Rights open access
Relations
[NCID]AN1046804X
Schools 機器分析センター