Reliability assessment based on hazard rate model for an embedded OSS porting-phase

Software testing, verification & reliability Volume 23 Issue 1 Page 77-88

published_at 2013-01

Title

Creators Tamura Yoshinobu

Creators Yamada Shigeru

Creator Keywords

reliability embedded system open source software modeling

Languages eng

Resource Type journal article

Publishers Wiley

Date Issued 2013-01

File Version Not Applicable (or Unknown)

Access Rights metadata only access

Relations

[ISSN]0960-0833

[ISSN]1099-1689

[NCID]AA1101041X

[NCID]AA11627500

info:doi/10.1002/stvr.455

[isVersionOf] [URI]http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1099-1689

Schools 大学院理工学研究科（工学）